Rudolph Technologies rudolphtech.com


Rudolph Technologies designs, develops, manufactures and supports defect inspection, process control metrology, and data analysis systems and software used by semiconductor device manufacturers. Rudolph delivers comprehensive solutions throughout the fab with its families of proprietary products that provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down costs and time to market of their devices. On October 28. 2019, Rudolph Technologies was acq...Show all

Rudolph Technologies designs, develops, manufactures and supports defect inspection, process control metrology, and data analysis systems and software used by semiconductor device manufacturers. Rudolph delivers comprehensive solutions throughout the...Show all

Company (Acquired)

Phone: 973-448-4401

Fax:

16 Jonspin Road

Wilmington, 01887
Massachusetts, United States

Latest News

See more competitors data Competitors
Total Funding Date of Last Funding
Rudolph Technologies $223.2M Oct 28, 2019

Web Traffic

Rank

Show (-10)

Engagement (PVPU)

Show (+1%)

Domain Authority Score
Show
Page Views Per Million (PVPM)
Show
Reach Per Million
Show

SEO Statistics

Domain Authority Score Show
Page Authority Score Show
No. External Links Show
No. Links Show

Web Traffic Statistics - Growth

Per Week Per Month Per 6 Months Per Year
Rank Login to see details
Page Views Per Million Login to see details
Page Views Per User Login to see details
Reach Per Million Login to see details

Related Rudolph Technologies Jobs

jobs by Indeed job
						search

Investors

Investor Investor Type Location Participating Rounds
See all 2 investors
There is no Board of Directors data available for this company. Please select another tab.
There is no Competitors data available for this company. Please select another tab.

Patents

Title Application Date Patent Date Status
(Patent / Application)
Substrate handling and identification mechanism Dec 21, 2017 May 26, 2020 Patent
Inspection of substrates Mar 22, 2018 Feb 04, 2020 Patent
Semiconductor device inspection of metallic discontinuities Mar 22, 2018 Nov 05, 2019 Patent
High speed autofocus system Jul 13, 2016 Sep 10, 2019 Patent
Opto-acoustic metrology of signal attenuating structures Nov 08, 2016 Feb 19, 2019 Patent
See all 97 patents