Rudolph Technologies rudolphtech.com


Rudolph Technologies designs, develops, manufactures and supports defect inspection, process control metrology, and data analysis systems and software used by semiconductor device manufacturers. Rudolph delivers comprehensive solutions throughout the fab with its families of proprietary products that provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down costs and time to market of their devices.

Rudolph Technologies designs, develops, manufactures and supports defect inspection, process control metrology, and data analysis systems and software used by semiconductor device manufacturers. Rudolph delivers comprehensive solutions throughout the...Show all

Company (IPO / Went public)

Phone: 978-253-6200

Fax:

16 Jonspin Road

Wilmington, 01887
Massachusetts, United States

Latest News

See more competitors data Competitors
Total Funding Date of Last Funding
Rudolph Technologies $223.2M Nov 19, 1999

Web Traffic

Rank

Show (-10)

Engagement (PVPU)

Show (+1%)

Domain Authority Score
Show
Page Views Per Million (PVPM)
Show
Reach Per Million
Show

SEO Statistics

Domain Authority Score Show
Page Authority Score Show
No. External Links Show
No. Links Show

Web Traffic Statistics - Growth

Per Week Per Month Per 6 Months Per Year
Rank Login to see details
Page Views Per Million Login to see details
Page Views Per User Login to see details
Reach Per Million Login to see details

Related Rudolph Technologies Jobs

jobs by Indeed job
						search

Investors

Investor Investor Type Location Participating Rounds
See all 2 investors
There is no Board of Directors data available for this company. Please select another tab.
There is no Competitors data available for this company. Please select another tab.

Patents

Title Application Date Patent Date Status
(Patent / Application)
Assessing alignment of top and bottom ends of tsvs and characterizing microfabrication process Jan 23, 2014 Apr 24, 2018 Patent
Flying sensor head Jun 27, 2013 Sep 26, 2017 Patent
Wafer shape thickness and trench measurement Apr 08, 2011 Jul 25, 2017 Patent
Method of measuring and assessing a probe card with an inspection device Jun 06, 2014 Jun 20, 2017 Patent
Inspection of substrates using calibration and imaging Sep 27, 2013 May 30, 2017 Patent
See all 90 patents