Luphos has technology utilizing multi-wavelength laser interferometry (MWLI). Their non-contact metrology technology provides highly accurate, nanometer level measurements of complex lenses and optical surfaces.
|Title||Application Date||Patent Date||Status
(Patent / Application)
|Method and device for highly-precise measurement of surfaces||Aug 20, 2013||Sep 26, 2017||Patent|
|Method and device for measuring surfaces in a highly precise manner||Feb 08, 2012||May 27, 2014||Patent|