Exnodes exnodes.com


Exnodes develops Computational Parallel Inspection as a breakthrough technology to solve the problem of plummeting yields in leading edge semiconductor chips. This technology enables rapid detection, identification, and root-cause analysis required to eliminate nanoscale defects inherent in leading edge semiconductor fabrication.

Exnodes develops Computational Parallel Inspection as a breakthrough technology to solve the problem of plummeting yields in leading edge semiconductor chips. This technology enables rapid detection, identification, and root-cause analysis required t...Show all

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41688 Christy Street

Fremont, 94538
California, United States

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Total Funding Date of Last Funding
Exnodes $2M Nov 1, 2016

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Patents

Title Application Date Patent Date Status
(Patent / Application)
Computational wafer inspection filter design Nov 04, 2014 Jul 04, 2017 Patent
Distributed wafer inspection Nov 28, 2014 Apr 04, 2017 Patent
Lenticular wafer inspection Oct 20, 2014 Dec 20, 2016 Patent
Multiple angle computational wafer inspection Oct 15, 2014 Jul 19, 2016 Patent
Certified wafer inspection Nov 18, 2014 Apr 26, 2016 Patent
See all 9 patents