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Delmic creates high-performance correlative light and electron microscopy and cathodoluminescence solutions for the life sciences and materials science.
Company (Alive / Active)
Phone: +31 (0)15 744 01 58
Kanaalweg 4
Delft, 2628 EB
Netherlands
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| Title | Application Date | Patent Date | Status (Patent / Application) |
|---|---|---|---|
| Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope | Jul 20, 2015 | May 12, 2020 | Patent |
| Method and apparatus for determining a density of fluorescent markers in a sample | Feb 06, 2015 | Nov 20, 2018 | Patent |
| Integrated optical and charged particle inspection apparatus | Apr 02, 2013 | Jul 25, 2017 | Patent |
| Integrated optical and charged particle inspection apparatus | Sep 16, 2013 | Jun 28, 2016 | Patent |
| Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatus | Jul 14, 2011 | Nov 25, 2014 | Patent |
