Allstron Corporation allstron.com


Allstron was established in 2008 in Taipei, Taiwan. With years of R&D innovation, Allstron Corporation has developed a wide range of RF products for wafer probing. This includes probes and calibration substrates for applications such as production test, RF Device Characterization, Modeling and Circuit Board Test.

Allstron was established in 2008 in Taipei, Taiwan. With years of R&D innovation, Allstron Corporation has developed a wide range of RF products for wafer probing. This includes probes and calibration substrates for applications such as production t...Show all

Company (Acquired)

Phone: +886 3 211 5781

Fax:

2F No.8 Hsin-Hua 5th St
Guey Shan County
333
Taiwan

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Total Funding Date of Last Funding
Allstron Corporation $0M Jun 2, 2014

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Patents

Title Application Date Patent Date Status
(Patent / Application)
Cantilever type probe head having introducing portion with end face having a tapered portion and an extended rectangular portion Apr 14, 2009 Jul 12, 2011 Patent
Probe card and method for assembling the same Aug 23, 2007 Aug 25, 2009 Patent